A to Z List of E-Journals
| Title | Collection | Publisher | Subject | Access From | Access To | URL |
|---|---|---|---|---|---|---|
| 1149.1b-1994 - IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1) | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=3272 | |
| 1149.4-1999 - IEEE Standard for a Mixed-Signal Test Bus | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; |
2006-01-23 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6785 | |
| 1149.4-2010 - IEEE Standard for a Mixed-Signal Test Bus | IEL Online |
IEEE |
Power; Energy and Industry Applications; Signal Processing and Analysis; |
2011-03-22 |
https://ieeexplore.ieee.org/servlet/opac?punumber=5738196 | |
| 1149.5-1995 - IEEE Standard for Module Test and Maintenance Bus (MTM-Bus) Protocol | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=3706 | |
| 1149.6-2003 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; |
2003-04-29 |
https://ieeexplore.ieee.org/servlet/opac?punumber=8513 | |
| 1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks | IEL Online |
IEEE |
Power; Energy and Industry Applications; Communication; Networking and Broadcast Technologies |
2016-03-18 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7436701 | |
| 1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks - Redline | IEL Online |
IEEE |
Power; Energy and Industry Applications; Communication; Networking and Broadcast Technologies |
2016-06-02 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7484239 | |
| 1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; |
2010-02-17 |
https://ieeexplore.ieee.org/servlet/opac?punumber=5412864 | |
| 1149.8.1-2012 - IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components | IEL Online |
IEEE |
Power; Energy and Industry Applications, |
2012-08-03 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6259813 | |
| 115-1983 - IEEE Guide: Test Procedures for Synchronous Machines | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2002-12-10 |
https://ieeexplore.ieee.org/servlet/opac?punumber=2620 | |
| 115-1995 - IEEE Guide: Test Procedures for Synchronous Machines Part I--Acceptance and Performance Testing Part II-Test Procedures and Parameter Determination for Dynamic Analysis | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4208 | |
| 115-2009 - IEEE Guide for Test Procedures for Synchronous Machines Part I—Acceptance and Performance Testing Part II—Test Procedures and Parameter Determination for Dynamic Analysis | IEL Online |
IEEE |
Power; Energy and Industry Applications, |
2010-05-13 |
https://ieeexplore.ieee.org/servlet/opac?punumber=5464493 | |
| 115-2009 - IEEE Guide for Test Procedures for Synchronous Machines Part I—Acceptance and Performance Testing Part II—Test Procedures and Parameter Determination for Dynamic Analysis - Redline | IEL Online |
IEEE |
Power; Energy and Industry Applications; Transportation; Components |
2011-07-12 |
https://ieeexplore.ieee.org/servlet/opac?punumber=5953451 | |
| 115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; Power |
2020-03-30 |
https://ieeexplore.ieee.org/servlet/opac?punumber=9050932 | |
| 115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis - Redline | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; Power |
2020-05-13 |
https://ieeexplore.ieee.org/servlet/opac?punumber=9093251 | |
| 1150-1991 - IEEE Trial-Use Recommended Practice for Integrating Power Plant Computer-Aided Engineering (CAE) Applications | IEL Online |
IEEE |
Power; Energy and Industry Applications, |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=2922 | |
| 1154-1991 - IEEE Standard for Programmed Inquiry, Learning, or Teaching (PILOT) | IEL Online |
IEEE |
Computing and Processing; Components; Circuits; Devices and Systems |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=2270 | |
| 1155-1992 - IEEE Standard for VMEbus Extensions for Instrumentation: VXIbus | IEL Online |
IEEE |
Computing and Processing; Components; Circuits; Devices and Systems |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=2798 | |
| 1156.1-1993 - IEEE Standard Microcomputer Environmental Specifications for Computer Modules | IEL Online |
IEEE |
Computing and Processing; Components; Circuits; Devices and Systems |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=2796 | |
| 1156.2-1996 - IEEE Standard for Environmental Specifications for Computer Systems | IEL Online |
IEEE |
Computing and Processing; Components; Circuits; Devices and Systems |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4026 |
