A to Z List of E-Journals
| Title | Collection | Publisher | Subject | Access From | Access To | URL |
|---|---|---|---|---|---|---|
| 1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2011-01-31 |
https://ieeexplore.ieee.org/servlet/opac?punumber=5706288 | |
| 1671.1-2009 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions | IEL Online |
IEEE |
Computing and Processing, |
2014-04-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6781519 | |
| 1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; Power |
2009-12-11 |
https://ieeexplore.ieee.org/servlet/opac?punumber=5353115 | |
| 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions | IEL Online |
IEEE |
Computing and Processing, |
2021-05-31 |
https://ieeexplore.ieee.org/servlet/opac?punumber=9444767 | |
| 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions | IEL Online |
IEEE |
Computing and Processing; Power; Energy and Industry Applications; |
2018-03-19 |
https://ieeexplore.ieee.org/servlet/opac?punumber=8319887 | |
| 1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; Power |
2008-12-22 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4723949 | |
| 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2013-02-14 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6461895 | |
| 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline | IEL Online |
IEEE |
Computing and Processing; Components; Circuits; Devices and Systems |
2013-05-31 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6522436 | |
| 1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2008-03-26 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4479536 | |
| 1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description | IEL Online |
IEEE |
Computing and Processing; Power; Energy and Industry Applications; |
2018-04-12 |
https://ieeexplore.ieee.org/servlet/opac?punumber=8337142 | |
| 1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2008-05-02 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4509492 | |
| 1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration | IEL Online |
IEEE |
Computing and Processing; Power; Energy and Industry Applications; |
2014-04-30 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6808400 | |
| 1671.5-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information | IEL Online |
IEEE |
Computing and Processing, |
2014-04-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6781501 | |
| 1671.5-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; Power |
2009-02-13 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4733021 | |
| 1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description | IEL Online |
IEEE |
Computing and Processing, |
2015-05-06 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7102656 | |
| 1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline | IEL Online |
IEEE |
Computing and Processing, |
2015-07-24 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7166296 | |
| 1671.6-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information | IEL Online |
IEEE |
Computing and Processing; Power; Energy and Industry Applications; |
2014-05-02 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6809828 | |
| 1671.6-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; Power |
2008-12-22 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4723925 | |
| 1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description | IEL Online |
IEEE |
Computing and Processing, |
2015-05-06 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7102653 | |
| 1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline | IEL Online |
IEEE |
Computing and Processing, |
2015-06-05 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7118619 |
