VLSI Design, Automation and Test(VLSI-DAT)

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2015-06-01

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=7111694

issn

978-1-4799-6276-1

eissn

978-1-4799-6275-4