Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2007-04-23

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4160867

issn

1-4244-0958-6

eissn

978-1-5090-8246-9