Proceedings of Technical Program of 2012 VLSI Design, Automation and Test

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2012-06-07

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=6204369

issn

978-1-4577-2080-2

eissn

978-1-4577-2081-9