4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2008-03-03

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4459488

issn

978-1-4244-3091-8

eissn

978-1-5090-7977-3