29th IEEE Semiconductor Thermal Measurement and Management Symposium

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2013-06-10

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=6520965

issn

978-1-4673-6427-0

eissn

978-1-4673-6429-4