22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2007-10-22

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4358358

issn

978-0-7695-2885-4

eissn

978-1-5090-8857-7