2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2023-07-27

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=10190355

issn

979-8-3503-0177-9

eissn

979-8-3503-0176-2