2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2022-07-19

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=9826118

issn

978-1-6654-6230-3

eissn

978-1-4503-9307-2