2021 IEEE/ACM 6th International Workshop on Metamorphic Testing (MET)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2021-07-12

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=9477445

issn

978-1-6654-4465-1

eissn

978-1-6654-4464-4