2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2020-12-29

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=9308021

issn

978-1-7281-8557-6

eissn

978-1-7281-8556-9