2019 IEEE/ACM 4th International Workshop on Metamorphic Testing (MET)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2019-08-05

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=8778445

issn

978-1-7281-2236-6

eissn

978-1-7281-2235-9