2018 IEEE/ACM 3rd International Workshop on Metamorphic Testing (MET)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2018-09-10

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=8457070

issn

978-1-5386-6180-2

eissn

978-1-4503-5729-6