2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2017-06-29

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=7959834

issn

978-1-5386-0425-0

eissn

978-1-5386-0424-3