2016 International Conference on Condition Monitoring and Diagnosis (CMD)

Collection

IEL Online

Publisher

IEEE

Subject

Engineered Materials, Dielectrics and Plasmas

Access From

2016-12-01

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=7749537

issn

978-1-5090-3399-7

eissn

978-1-5090-3398-0