2015 IEEE International Test Conference (ITC)

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2015-12-03

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=7331771

issn

978-1-4673-6579-6

eissn

978-1-4673-6578-9