2015 19th International Symposium on VLSI Design and Test

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2015-08-20

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=7166536

issn

978-1-4799-1744-0

eissn

978-1-4799-1743-3