2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2013-06-17

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=6526674

issn

978-1-4673-4435-7

eissn

978-1-4673-4436-4