2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems

Collection

IEL Online

Publisher

IEEE

Subject

Power, Energy and Industry Applications

Access From

2010-11-11

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=5629473

issn

978-1-4244-8447-8

eissn

978-0-7695-4243-0