2010 IEEE 16th International On-Line Testing Symposium

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2010-09-02

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=5550907

issn

978-1-4244-7724-1

eissn

978-1-4244-7723-4