2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2010-04-08

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=5440519

issn

978-1-4244-9461-3

eissn

978-1-4244-9460-6