2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2009-04-03

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4805588

issn

978-1-4244-3664-4

eissn

978-1-4244-3665-1