2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2008-10-10

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4641141

issn

978-0-7695-3365-0

eissn

978-1-5090-8441-8