2007 Eighth International Workshop on Microprocessor Test and Verification

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2008-09-05

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4620135

issn

978-0-7695-3241-7

eissn

978-1-5090-8267-4