2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2007-02-12

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4030903

issn

0-7695-2706-X

eissn

978-1-5090-9793-7