2005 Sixth International Workshop on Microprocessor Test and Verification

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2007-02-20

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=4022212

issn

0-7695-2627-6

eissn

978-1-5090-9743-2