18th International Symposium on VLSI Design and Test

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2014-08-21

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=6873898

issn

978-1-4799-5088-1

eissn

978-1-4799-4006-6