1149.1b-1994 - IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1) |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
1988-01-01 |
|
1149.4-1999 - IEEE Standard for a Mixed-Signal Test Bus |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2006-01-23 |
|
1149.4-2010 - IEEE Standard for a Mixed-Signal Test Bus |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2011-03-22 |
|
1149.4-2024 - IEEE Standard for a Mixed-Signal Test Bus |
IEL Online |
IEEE |
Signal Processing and Analysis |
2024-12-03 |
|
1149.5-1995 - IEEE Standard for Module Test and Maintenance Bus (MTM-Bus) Protocol |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
1988-01-01 |
|
1149.6-2003 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2003-04-29 |
|
1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2016-03-18 |
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1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks - Redline |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2016-06-02 |
|
1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2010-02-17 |
|
1149.7-2022 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture |
IEL Online |
IEEE |
Computing and Processing |
2022-10-13 |
|
1149.7-2022 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture - Redline |
IEL Online |
IEEE |
Computing and Processing |
2024-09-10 |
|
1149.8.1-2012 - IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2012-08-03 |
|
115-1983 - IEEE Guide: Test Procedures for Synchronous Machines |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2002-12-10 |
|
115-1995 - IEEE Guide: Test Procedures for Synchronous Machines Part I--Acceptance and Performance Testing Part II-Test Procedures and Parameter Determination for Dynamic Analysis |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
1988-01-01 |
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115-2009 - IEEE Guide for Test Procedures for Synchronous Machines Part I—Acceptance and Performance Testing Part II—Test Procedures and Parameter Determination for Dynamic Analysis |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2010-05-13 |
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115-2009 - IEEE Guide for Test Procedures for Synchronous Machines Part I—Acceptance and Performance Testing Part II—Test Procedures and Parameter Determination for Dynamic Analysis - Redline |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2011-07-12 |
|
115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2020-03-30 |
|
115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis - Redline |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2020-05-13 |
|
1150-1991 - IEEE Trial-Use Recommended Practice for Integrating Power Plant Computer-Aided Engineering (CAE) Applications |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
1988-01-01 |
|
1154-1991 - IEEE Standard for Programmed Inquiry, Learning, or Teaching (PILOT) |
IEL Online |
IEEE |
Computing and Processing |
1988-01-01 |
|