A to Z List of E-Journals
| Title | Collection | Publisher | Subject | Access From | Access To | URL |
|---|---|---|---|---|---|---|
| 2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599) | IEL Online |
IEEE |
Engineered Materials; Dielectrics and Plasmas; Photonics and Electrooptics; Components |
2002-08-17 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7950 | |
| 2nd International Symposium on Plasma Process-Induced Damage | IEL Online |
IEEE |
Engineered Materials; Dielectrics and Plasmas; Fields; Waves and Electromagnetics |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4672 | |
| 2nd International Symposium on Search Based Software Engineering | IEL Online |
IEEE |
Computing and Processing; Communication; Networking and Broadcast Technologies; Power |
2010-11-11 |
https://ieeexplore.ieee.org/servlet/opac?punumber=5633360 | |
| 2nd International Workshop Networking with Ultra Wide Band and Workshop on Ultra Wide Band for Sensor Networks, 2005. Networking with UWB 2005. | IEL Online |
IEEE |
Communication; Networking and Broadcast Technologies; Computing and Processing; Components |
2005-07-25 |
https://ieeexplore.ieee.org/servlet/opac?punumber=9915 | |
| 2nd International Workshop on Automated Specification and Verification of Web Systems (WWV'06) | IEL Online |
IEEE |
Computing and Processing; |
2007-04-23 |
https://ieeexplore.ieee.org/servlet/opac?punumber=4155975 | |
| 2nd International Workshop on Biometrics and Forensics | IEL Online |
IEEE |
Computing and Processing; Signal Processing and Analysis |
2014-10-02 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6903649 | |
| 2nd ISA/IEEE Sensors for Industry Conference | IEL Online |
IEEE |
Signal Processing and Analysis; Components; Circuits; Devices and Systems |
2003-01-14 |
https://ieeexplore.ieee.org/servlet/opac?punumber=8326 | |
| 2nd Middle East Conference on Biomedical Engineering | IEL Online |
IEEE |
Components; Circuits; Devices and Systems; Computing and Processing |
2014-04-07 |
https://ieeexplore.ieee.org/servlet/opac?punumber=6775408 | |
| 2nd Smart Cities Symposium (SCS 2019) | IEL Online |
IET |
Communication; Networking and Broadcast Technologies; Components; Circuits |
2020-06-30 |
https://ieeexplore.ieee.org/servlet/opac?punumber=9124928 | |
| 2nd Workshop onEmbedded Systems for Real-Time Multimedia, 2004. ESTImedia 2004. | IEL Online |
IEEE |
Computing and Processing; Communication; Networking and Broadcast Technologies; |
2004-11-22 |
https://ieeexplore.ieee.org/servlet/opac?punumber=9398 | |
| 3 Biotech | Springer Link |
Springer Nature |
Chemistry and Materials Science |
1997 |
Current |
http://link.springer.com/journal/13205 |
| 3-1942 - AIEE Proposed Standard for Guiding Principles for the Selection of Reference Values for Electrical Standards | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2016-02-15 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7407273 | |
| 3-1943 - AIEE Standards for Guiding Principles for the Selection of Reference Values for Electrical Standards | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2016-02-15 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7407279 | |
| 3-1962 - AIEE Guiding Principles for the Selection of Reference Values for Electrical Standards | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2016-02-15 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7407282 | |
| 3-1982 - IEEE Recommended Practice in the Selection of Reference Ambient Conditions for Test Measurements of Electrical Apparatus | IEL Online |
IEEE |
Power; Energy and Industry Applications, |
2002-12-10 |
https://ieeexplore.ieee.org/servlet/opac?punumber=2540 | |
| 30-1937 - AIEE Definitions and General Standards for Wires and Cables | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2016-02-11 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7405211 | |
| 30-1944 - AIEE American Standard Definitions and General Standards for Wire and Cable | IEL Online |
IEEE |
Power; Energy and Industry Applications; Components; Circuits |
2016-02-11 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7405217 | |
| 300-1969 - USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation) | IEL Online |
IEEE |
Nuclear Engineering; Power; Energy and Industry Applications; Components |
2016-02-11 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7405205 | |
| 300-1982 - IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors | IEL Online |
IEEE |
Nuclear Engineering; Power; Energy and Industry Applications; Components |
2016-02-11 |
https://ieeexplore.ieee.org/servlet/opac?punumber=7405226 | |
| 300-1988 - IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors | IEL Online |
IEEE |
Nuclear Engineering, |
1988-01-01 |
https://ieeexplore.ieee.org/servlet/opac?punumber=2573 |
