Proceedings of 2010 International Symposium on VLSI Design, Automation and Test

Collection

IEL Online

Publisher

IEEE

Subject

Components, Circuits, Devices and Systems

Access From

2012-04-18

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=5484101

issn

978-1-4244-5269-9

eissn

978-1-4244-5271-2