2011 IEEE 17th International On-Line Testing Symposium

Collection

IEL Online

Publisher

IEEE

Subject

Computing and Processing

Access From

2011-08-22

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=5979170

issn

978-1-4577-1053-7

eissn

978-1-4577-1056-8