| 1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2018-12-13 |
|
| 1668-2014 - IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2014-09-11 |
|
| 1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2017-11-27 |
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| 1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2018-05-24 |
|
| 167-1966 - IEEE Test Procedure for Facsimile |
IEL Online |
IEEE |
Communication, Networking and Broadcast Technologies |
2015-12-29 |
|
| 1671-2006 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2009-09-18 |
|
| 1671-2006 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2006-12-19 |
|
| 1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2011-01-31 |
|
| 1671.1-2009 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
IEL Online |
IEEE |
Computing and Processing |
2014-04-01 |
|
| 1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2009-12-11 |
|
| 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions |
IEL Online |
IEEE |
Computing and Processing |
2018-03-19 |
|
| 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions |
IEL Online |
IEEE |
Computing and Processing |
2021-05-31 |
|
| 1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1 |
IEL Online |
IEEE |
Computing and Processing |
2024-04-25 |
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| 1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions |
IEL Online |
IEEE |
Components, Circuits, Devices and Systems |
2008-12-22 |
|
| 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2013-02-14 |
|
| 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline |
IEL Online |
IEEE |
Computing and Processing |
2013-05-31 |
|
| 1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2008-03-26 |
|
| 1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description |
IEL Online |
IEEE |
Computing and Processing |
2018-04-12 |
|
| 1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information |
IEL Online |
IEEE |
Power, Energy and Industry Applications |
2008-05-02 |
|
| 1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration |
IEL Online |
IEEE |
Computing and Processing |
2014-04-30 |
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